High density organic interconnect structures

ABSTRACT

Generally discussed herein are systems, devices, and methods that include an organic high density interconnect structure and techniques for making the same. According to an example a method can include forming one or more low density buildup layers on a core, conductive interconnect material of the one or more low density buildup layers electrically and mechanically connected to conductive interconnect material of the core, forming one or more high density buildup layers on an exposed low density buildup layer of the one or more low density buildup layers, conductive interconnect material of the high density buildup layers electrically and mechanically connected to the conductive interconnect material of the one or more low density buildup layers, and forming another low density buildup layer on and around an exposed high density buildup layer of the one or more high density buildup layers.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No.16/901,172, filed Jun. 15, 2020, which is a continuation of U.S. patentapplication Ser. No. 16/305,743, filed Nov. 29, 2018, now issued as U.S.Pat. No. 10,685,850, which is a U.S. National Stage Filing under 35U.S.C. 371 from International Application No. PCT/US2016/040481, filedon Jun. 30, 2016, each of which application is incorporated herein byreference in its entirety.

TECHNICAL FIELD

Embodiments generally relate to packages that can include high densityrouting in a substrate. Some embodiments can include a device with highdensity routing therein. In one or more embodiments, a localized highdensity interconnect structure can be surrounded (e.g., completely) byinorganic materials.

TECHNICAL BACKGROUND

Semiconductor devices, such as electronic devices, can include substraterouting that is of a lower density than some of the routing in a chipthat is attached to the substrate. Such devices can include complexrouting schemes especially in areas where the attached chip includeshigher density routing than the routing in the substrate.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings, which are not necessarily drawn to scale, like numeralsmay describe similar components in different views. Like numerals havingdifferent letter suffixes may represent different instances of similarcomponents. The drawings illustrate generally, by way of example, butnot by way of limitation, various embodiments discussed in the presentdocument.

FIGS. 1A-1H illustrate stages of an example of a process of creating adevice with a localized high density interconnect structure.

FIGS. 2A-2F illustrate stages of an example of a process for creatinganother device with a localized high density interconnect structure.

FIG. 3 is a schematic of an example of an electronic system in which adevice as discussed herein can be used.

DESCRIPTION OF EMBODIMENTS

Examples in this disclosure relate to devices and systems that include ahigh density interconnect structure embedded in a substrate. Examplesalso relate to techniques of making the systems and devices.

The following description includes terms, such as upper, lower, first,second, etc. that are used for descriptive purposes only and are not tobe construed as limiting. The examples of an apparatus, device, orarticle described herein can be manufactured, used, or shipped in anumber of positions and orientations. The terms “die” and “chip”generally refer to the physical object that is the basic workpiece thatis transformed by various process operations into the desired integratedcircuit device. A die is usually singulated from a wafer and wafers maybe made of semiconducting, non-semiconducting, or combinations ofsemiconducting and non-semiconducting materials.

Current board design can be created by incorporating a number ofheterogeneous functions, such as Computer Processing Unit (CPU) logic,graphics functions, cache memory, and other functions to createintegrated System on Chip (SoC) designs. Such SoC packages can lower thecomplexity of a product design and can reduce the number of componentsrequired by the product. Picking individual packages that implementthese functions and designing the board around the packages chosen canbe complex. Using individual packages can increase the system boardarea, power loss, complexity, component count, or costs over anintegrated SoC package solution.

The input/output (I/O) density in a package substrate can be a functionof a substrate's minimum pad size, minimum trace dimensions, minimumspace dimensions, and/or the capability of the manufacturing process.The routing density in a multichip substrate can be several orders ofmagnitude lower (e.g., about 100 times) than chip level routing density.This routing density can impact cost, size, and performance of aproduct.

A way to reduce the size of a product can include utilizing a siliconinterposer in a package to provide a high density chip-to-chipinterconnect. Such a solution includes a higher cost, such as can be dueto the cost of the silicon interposer, additional assembly and processsteps, and/or compounding yield loss.

A substrate can include a high density interconnect structure in abumpless buildup layer (BBUL) or other substrate. Such a solution canallow a high density interconnect structure to be situated where itwould be advantageous to include higher density interconnect routing andallow lower density interconnect routing (e.g., routing with a substraterouting technique) where such lower density routing may be advantageous,such as for routing power or ground lines.

Substrate routing can take up a significant amount of space and can be afactor in the overall size of a die package. By including routingcreated using typical substrate routing techniques, which generallyresults in less dense routing than chip routing techniques, there maynot be enough space to route signals from the die without routingthrough the die. Integrating a high density interconnect structure in apackage or substrate, such as a BBUL package or substrate, can allow foran increase in overall routing and interconnect density of a package,thus helping to reduce size and cost.

One previous solution included embedding a high density, siliconinterconnect device in a substrate. Assembly of such a package can bechallenging due to tight tolerance requirements in x, y, and zdirections. The tight tolerance requirements are due, at least in part,to alignment and fitting issues in connecting the chip interconnectdevice to the substrate. In addition, using a chip interconnect device(e.g., a silicon interconnect device) can include embedding theinterconnect device during the substrate fabrication process.

High speed communication between a central processing unit (CPU) packageand a memory package in a multi-chip package (MCP) substrate can be achallenging area of development. This challenge can be made moredifficult using materials with low signal loss. Multiple advancements infaster signal transfer speeds have led to technologies such as EmIB™(embedded interconnect bridge), developed by Intel Corporation of SantaClara, Calif., United States, and stacked die (2.5D, 3D). Multiple otheropen source appropriate technologies (OSATs) have been developed to helpincrease signal transfer speeds.

Apart from reliability challenges due to an embedded die, theconstruction of current EmIB™ architecture allows for verticalconnections on only a single side of the high density interconnectstructure. Since, in using EmIB™, the high density interconnectstructure is embedded in the substrate using a die backside film (DBF)layer, the routing is limited to only a single side of the high densityinterconnect device. The design limits the signal transfer from thebottom of the high density interconnect device. Such interconnectstructures do not provide a manner of electrically forming connectionswith the bottom side of the EmIB™ structure. It can be advantageous toinclude a signal path through the EmIB™ structure. Thus, it could beadvantageous to develop a cost-effective process of creating a highdensity interconnect structure with electrical connections on opposingsurfaces of the high density interconnect structure. Having high densityrouting on every layer and entire area of the substrate may not benecessary for some applications. If some part of the substrate caninclude high density routing, such as can include a flip chip ball gridarray (FCBGA), while the rest of the substrate maintains printed circuitboard (PCB)-like density routing, the overall cost and/or complexity ofthe substrate can be reduced.

Other solutions to including higher density signal routing through ahigh density interconnect device can include a 2.5D/3D die stackapproach, which involves expensive and tedious process of throughsilicon vias (TSVs) that can impact cost of the substrate.

Devices, systems, and/or processes discussed herein can help in solvingat least two issues: (1) opposing surface interconnection capability onthe high density interconnect structure, such as to allow signalcommunication between two actives (e.g., one device coupled to eachopposing surface of the high density interconnect device), such as toprovide more package design flexibility, and (2) providing a localizedhigh density routing region within a low density (cheaper) densityrouting substrate, such as to provide at least some cost mitigation.

Enabling of localized high density (HD) vertical interconnect structurewithin low density substrate can be driven by an ability to develop anduse either: (1) implementation of photo-imageable dielectric (PID)materials where HD patterning will be used, and development and removalof PID material in non-HD zones (e.g., in lower density routing zones)or (2) formation of a release layer to selectively build lower andhigher density substrate layers in locations of interest.

Use of a vertical interconnect localized HD-organic device, unlikeEmIB™, provides design flexibility to route through the HD-organicdevice to layers below the HD-organic bridge as well as the layers abovethe HD-organic bridge. The use of PID or other build up (BU) material,as compared to a silicon (Si) die, provides an advantage to mechanicalreliability through thermal cycling. This can be due, at least in part,to improved crack resistance/higher toughness of polymer materials overthe more rigid silicon materials of the Si die. The verticalinterconnect design does not generally have the challenges related tostress cracks that can form when using the EmIB™ structure.

To summarize, the proposed architecture can have one or more of thefollowing advantages over EmIB™ and other high density interconnectstructures: (1) Improved signal routing in all directions within thepackage, especially in the direction below the high density interconnectdevice, (2) Fewer crack related concerns due to better mechanicalproperties of organic BU/PID materials over Si materials, (3) No need toshare active/passive dies with the substrate suppliers, and/or (4) Thinlayers of routing possible with no general effect on substrate/panelwarpage related, such as can be due to low modulus of elasticity (E) ofbuildup (BU) and photo-imageable dielectric (PID) materials as comparedto silicon (Si), that causes an inherent front to back (F/B) coefficientof thermal expansion (CTE) mismatch.

HD packaging has been typically achieved by Patch on Interposer (PoINT)or PoINT with cavity or skewed BU substrate. The 2.5 and 3D approachesinvolve multiple level interconnect assembly process, along withlimitations on Z-height, the PoINT process can lead to panel levelwarpage due to imbalance in architecture. The whole area of any layermay not need high density packaging. Hence, the PoINT approach isfurther constraining.

The present idea specifically allows for HD-routing in a smaller areawithin a localized area and/or layer of the device, and hence can be amore flexible architecture as compared to other prior options. Alocalized high density interconnect structure formation process can beoptimized for removing the non-HD zone vs. forming lithography basedvias within the HD zone. One way to do so is to develop organic PIDmaterial in steps (e.g., first, the non-HD zone, then, the HD zone). Anarea, which can be important in this process flow, can includeidentifying a release layer that is not contaminated in a developmentsolution, such as in case of PID or in case of desmear bath in case ofBU film. When a material is in an acidic or basic solution wet chemistrybaths like development chemistry bath for PID or desmear chemistry bathfor BU, these release films can be dissolved or leaked into them andcontaminate or reduce the bath life, which can adversely affect the PIDor BU.

Reference will now be made to the drawings wherein like structures willbe provided with like suffix reference designations. In order to showthe structures of various examples clearly, the drawings included hereinare diagrammatic representations of integrated circuit structures. Thus,the actual appearance of the fabricated structures, for example in aphotomicrograph, may appear different while still incorporating subjectmatter of the illustrated examples. Moreover, the drawings show thestructures to aid in understanding the illustrated examples.

FIG. 1A illustrates, by way of example, a cross-section diagram of anembodiment of a device 100A. The device 100A as illustrated includes acore 102 with conductive interconnect material 104 in the core 102 andon a first surface 106A and a second surface 106B of the core 102. Thecore 102 can include a cured resin and glass cloth combination, ceramic,glass, thermoplastic material, a combination thereof, or other corematerial. The conductive interconnect material 104 can include aconductive material, such as copper, aluminum, tin, silver, gold,titanium, a combination thereof, or other conductive material. Theconductive interconnect material 104 can provide a path for anelectrical signal to travel through the core 102 (e.g., between theconductive interconnect material 104 on the first and second surfaces106A-B of the core 102).

FIG. 1B illustrates, by way of example, a cross-section diagram of anembodiment of a device 100B that includes the device 100A with a firstlow density buildup layer (i.e. an inorganic buildup material 108 and alow density conductive interconnect material 110) situated on/over thetop surface 106A and the bottom surface 106B of the core 102. The firstlow density buildup layer includes an inorganic buildup material 108 anda conductive interconnect material 110 in and on the buildup material108. The buildup material 108 can include an Ajinomoto buildup film(ABF) or other buildup material including that of a sheet or liquidtype. The conductive interconnect material 110 can include a materialthat is similar to the conductive interconnect material 104.

To form the device 100B, from the device 100A, the buildup material 108can be situated on (e.g., laminated on) the core 102 and the conductiveinterconnect material 104. The buildup material 108 can then be cured.Via holes can be drilled through the buildup material 108, such as toexpose a portion of the conductive interconnect material 104. Theconductive interconnect material 110 can be plated in the via holes andon the buildup material 108.

FIG. 1C illustrates, by way of example, a cross-section diagram of anembodiment of a device 100C that includes two more low density builduplayers (e.g., second and third low density buildup layers) on both sidesof the device 100B after the conductive material 110 is etched. Thesecond low density buildup layer includes an inorganic buildup layer 112and conductive interconnect material 114. The third low density builduplayer includes an inorganic buildup material 116 and conductiveinterconnect material 118. Note that while the number of low densitybuildup layers on the top and bottom surface 106A-B of the core 102 areillustrated as being the same, the number of low density buildup layerson the top and bottom surfaces 106A-B of the core 102 can be the same ordifferent. For example, the number of low density buildup layers on thetop surface 106A can be N, where N is a positive integer, and the numberof low density buildup layers on the bottom surface 106B can be M, whereM is a positive integer different or the same as N.

The second and third low density buildup layers can be formed using thesame process as the process used for forming the first low densitybuildup layer. Before forming the second and third low density builduplayers, the conductive interconnect material 110 can be etched to removeportions thereof and pattern the conductive interconnect material 110.After etching the conductive interconnect material 110 and beforeforming the second low density interconnect layer, the buildup material108 can be cured a second time.

A height 120 of the conductive interconnect material 118 above thebuildup material 116 can be greater than five microns. In one or moreembodiments the height 120 can be greater than ten microns. In one ormore other embodiments, the height 120 can be about or greater thanfifteen microns or more.

FIG. 1D illustrates, by way of example, a cross-section diagram of anembodiment of a device 100D that includes the device 100C after agrinding process has reduced the height 120 of at least some of theconductive interconnect material 118 to form the conductive interconnectmaterial 122. A height 124 of the conductive interconnect material 122can be less than fifteen microns, such as can be about ten microns, fivemicrons, or other height less than the height 120. In one or moreembodiments, the grinding can include a chemical mechanicalplanarization (CMP). The CMP is a technique of using chemical andmechanical forces to smooth a surface, such as can include chemicaletching and abrasive polishing.

After the conductive interconnect material 122 is formed, an adhesionpromoting material 126 can be situated on the conductive interconnectmaterial 122. The adhesion promoting material 126 can include CZ,modified CZ, Novaband, Glicap, or a mechanically roughened surface toenhance a number of anchor points, or a chemical with a terminationgroup that binds to the conductive surface on one end and the buildupfilm at another end. The adhesion promoting material 126 can helpincrease a bond strength between the conductive interconnect material122 and an organic buildup material 128 (see FIG. 1E). Such an increasedbond strength can help keep the organic buildup material heightsufficiently small, such as to help reduce a form a factor of aresulting device. The heights of the conductive interconnect material122 and 118 on the same low density buildup layer can be different. Theheight 124 of the conductive interconnect material 122 is less than theheight 120 of the conductive interconnect material 118.

FIG. 1E illustrates, by way of example, a cross-section diagram of anembodiment of a device 100E that includes the device 100D after anorganic buildup material 127 and a photo resist material 129 aresituated on the device 100D. The buildup material 127 can include anorganic material, such as can include an epoxy-based laminate composite,such as an Ajinomoto buildup film. The high density organic buildupmaterial 127 can be situated using a lamination or other process. Thephoto resist material 129 can include a dry film or a liquid material.The photo resist material 129 can be situated using a lamination orcoating process (if it is a liquid).

FIG. 1F illustrates, by way of example, a cross-section diagram of anembodiment of a device 100F that includes the device 100E after a firsthigh density buildup layer (i.e. organic buildup material 128 andconductive interconnect material 130) is formed in a localized region ofthe device 100F. The organic buildup material 128 can include a PID.

To form the device 100F, from the device 100E, the buildup material 127can be situated on (e.g., laminated on) the buildup material 116, theconductive interconnect material 122, and/or the conductive interconnectmaterial 118. Portions of the buildup material 127 can be removed fromthe device 100E, such as by exposing and developing the portions of theorganic buildup material 128 to be removed (i.e. portions of the buildupmaterial 127 exposed by the photo resist material 129). The photo resistmaterial 129 can be removed therefrom, such as by using an aqueoussolution of sodium carbonate (Na2CO3) or tetramethylammonium hydroxide(TMAH). The remaining buildup material 128 can be cured. Via holes canbe drilled into the remaining buildup material 128, such as to expose aportion of the conductive interconnect material 122. Then anelectrolytic plating process can be used to create the conductiveinterconnect material 130. The electrolytic plating process can includedepositing a seed layer on the buildup material 128 and exposed portionsof the conductive interconnect material 122. A dry film resist (DFR) canbe patterned on the seed layer, conductive material can beelectrolytically plated around the DFR, and the conductive material canbe etched to remove excess conductive interconnect material. The DFR canbe stripped and an adhesion promoter 132 can be situated on exposedportions of the conductive interconnect material 130.

The dashed box 131 indicates a footprint region of the high densitybuildup layers. The conductive interconnect material within the dashedbox 131 is generally the conductive interconnect material that can bereduced in height.

FIG. 1G illustrates, by way of example, a cross-section diagram of anembodiment of a device 10G that includes the device 100F after secondand third high density buildup layers and a fourth low density builduplayer are formed on the device 100F. The second high density builduplayer includes an organic buildup material 134 and conductiveinterconnect material 136. The third high density buildup layer includesan organic buildup material 138 and conductive interconnect layer 140.The fourth low density buildup layer includes a fourth buildup material142 and conductive interconnect material 144.

The second and third high density buildup layers can be formed using asame technique as described with regard to the first high densitybuildup layer. While the device 100G includes three high density builduplayers, any number of high density buildup layers greater than zero canbe used. The high density buildup layers are localized, such as toprovide high density interconnect routing in only a region of the device100G.

The fourth low density buildup layer can be formed using a sametechnique as described with regard to the first low density builduplayer. The fourth buildup material 142 is situated on the third buildupmaterial 116, conductive interconnect material 118, a top layer of theorganic buildup material (e.g., the organic buildup material 136 of thedevice 100G), and a top layer of conductive interconnect material in ahigh density interconnect region (e.g., the conductive interconnectmaterial 140 of the device 100G). The buildup material 142 can surroundthe high density interconnect region (i.e. all of the high densitybuildup layers, such as the first, second, and third high densitybuildup layers of the device 100G).

FIG. 1H illustrates, by way of example, a cross-section diagram of anembodiment of a device 100H that includes the device 100G after a solderresist 146 is laminated and patterned on both exposed surfaces of thedevice 100G. The solder resist 146 can be patterned to expose portionsof the conductive interconnect material 144. The conductive interconnectmaterial 144 and 118 can provide access to low density routing (i.e.conductive interconnect material in the low density buildup layers) andhigh density routing (e.g., conductive interconnect material in the highdensity buildup layers) in the device 100H. A die/chip/package can beattached to the device 100H, such as by electrically connecting pads ofthe die/chip/package to the conductive interconnect material 144 and/or118. The solder resist 146 can include a photo-definable solder resistmaterials having epoxide, amines, and/or acrylic groups.

FIG. 2A illustrates, by way of example, a cross-section diagram of anembodiment of a device 200A that includes the device 100C after asacrificial material 202 is situated on the third buildup material 116,the conductive interconnect material 118, a laser resist material 204,and a first high density buildup layer is formed on the third buildupmaterial 116, the conductive interconnect material 118, the laser resistmaterial 204, and the sacrificial material 202. The first high densitybuildup layer can be formed using a technique discussed with regard toFIG. 1E. The laser resist material 204 can include the same material asthe conductive interconnect material 118 and can be patterned on thedevice at a same or different time as the conductive interconnectmaterial 118. Other materials for the laser resist material 204 arepossible.

FIG. 2B illustrates, by way of example, a cross-section diagram of anembodiment of a device 200B that includes the device 200A after a secondhigh density buildup layer (i.e. an organic buildup material 210 andconductive interconnect material 212) and third high density builduplayer (i.e. an organic buildup material 214 and conductive interconnectmaterial 216) are formed on the first high density buildup layer and thesacrificial material 202. The second and third high density builduplayers can be formed using a technique similar to or the same as thetechnique used to form other high density buildup layers discussedherein.

FIG. 2C illustrates, by way of example, a cross-section diagram of anembodiment of a device 200C that includes the device 200B after notches218A and 218B are formed therein. The notches 218A-B divide the organicbuildup materials 206, 210, and 214 into multiple respective sections(e.g., organic buildup material 206 is divided into organic builduplayer sections 206A, 206B, and 206C; organic buildup material 210 isdivided into organic buildup layer sections 210A, 210B, and 210C; andorganic buildup material 214 is divided into organic buildup layersections 214A, 214B, and 214C as illustrated in FIG. 2C). The notches218A-B isolate the sacrificial material 202 and any materials on thesacrificial material 202 from the remainder of the device 200C. Thenotches 218A-B can be formed using a laser to form the notch up to thelaser resist material 204.

FIG. 2D illustrates, by way of example, a cross-section diagram of anembodiment of a device 200D that includes the device 200C after thesacrificial material 202 (and material on the sacrificial material 202)has been removed from the device 200C. Removing the sacrificial material202 removes the organic buildup material sections 206A, 210A, 214A,206C, 210C, and 214C, in the example of the device 200C. Removing thesacrificial material 202 can expose portions of the buildup material116, the conductive interconnect material 118, and the laser resistmaterial 204.

FIG. 2E illustrates, by way of example, a cross-section diagram of anembodiment of a device 200E that includes the device 200D after a fourthlow density buildup layer is formed on the third high density builduplayer and the second low density buildup layer. The fourth low densitybuildup layer includes the buildup material 142 and the conductiveinterconnect material 144. The fourth low density buildup layer can beformed used a same or similar technique as is used to from other lowdensity buildup layers discussed herein.

FIG. 2F illustrates, by way of example, a cross-section diagram of anembodiment of a device 200F that includes the device 200E after solderresist 146 has been formed on the device 200E. The solder resist 146 canbe formed in the same manner as and include the same materials as thesolder resist as discussed with regard to FIG. 1G. One or moredies/chips/packages can be electrically connected to the device 200F ina manner similar to that discussed with regard to the device 100G.

Note that while the description of the FIGS. discusses forming thebuildup material (organic or other buildup layers) first, and thenforming the conductive interconnect material on those layers, theconductive interconnect material can be deposited and formed before thebuildup material, and the buildup material can be situated around theconductive interconnect material.

As used herein “low density” and “high density” are to be understoodrelative to one another. Low density means that it includes routing thatis less dense than a corresponding high density. For example, a lowdensity buildup layer includes routing (conductive interconnectmaterial) that is less dense than routing a high density buildup layer.In one or more embodiments, high density routing is up to about onehundred times more dense than low density routing.

FIG. 3 illustrates, by way of example, a logical block diagram of anembodiment of system 300. In one or more embodiments, system 300includes one or more components that can include a high densitystructure as discussed herein.

In one embodiment, processor 310 has one or more processing cores 312and 312N, where 312N represents the Nth processor core inside processor310 where N is a positive integer. In one embodiment, system 300includes multiple processors including 310 and 305, where processor 305has logic similar or identical to the logic of processor 310. In someembodiments, processing core 312 includes, but is not limited to,pre-fetch logic to fetch instructions, decode logic to decode theinstructions, execution logic to execute instructions and the like. Insome embodiments, processor 310 has a cache memory 316 to cacheinstructions and/or data for system 300. Cache memory 316 may beorganized into a hierarchal structure including one or more levels ofcache memory.

In some embodiments, processor 310 includes a memory controller 314,which is operable to perform functions that enable the processor 310 toaccess and communicate with memory 330 that includes a volatile memory332 and/or a non-volatile memory 334. In some embodiments, processor 310is coupled with memory 330 and chipset 320. Processor 310 may also becoupled to a wireless antenna 378 to communicate with any deviceconfigured to transmit and/or receive wireless signals. In oneembodiment, the wireless antenna interface 378 operates in accordancewith, but is not limited to, the IEEE 802.11 standard and its relatedfamily, Home Plug AV (HPAV), Ultra Wide Band (UWB), Bluetooth, WiMax, orany form of wireless communication protocol.

In some embodiments, volatile memory 332 includes, but is not limitedto, Synchronous Dynamic Random Access Memory (SDRAM), Dynamic RandomAccess Memory (DRAM), RAMBUS Dynamic Random Access Memory (RDRAM),and/or any other type of random access memory device. Non-volatilememory 334 includes, but is not limited to, flash memory, phase changememory (PCM), read-only memory (ROM), electrically erasable programmableread-only memory (EEPROM), or any other type of non-volatile memorydevice.

Memory 330 stores information and instructions to be executed byprocessor 310. In one embodiment, memory 330 may also store temporaryvariables or other intermediate information while processor 310 isexecuting instructions. In the illustrated embodiment, chipset 320connects with processor 310 via Point-to-Point (PtP or P-P) interfaces317 and 322. Chipset 320 enables processor 310 to connect to otherelements in system 300. In some embodiments of the invention, interfaces317 and 322 operate in accordance with a PtP communication protocol suchas the Intel® QuickPath Interconnect (QPI) or the like. In otherembodiments, a different interconnect may be used.

In some embodiments, chipset 320 is operable to communicate withprocessor 310, 305N, display device 340, and other devices. Chipset 320may also be coupled to a wireless antenna 378 to communicate with anydevice configured to transmit and/or receive wireless signals.

Chipset 320 connects to display device 340 via interface 326. Display340 may be, for example, a liquid crystal display (LCD), a plasmadisplay, cathode ray tube (CRT) display, or any other form of visualdisplay device. In some embodiments of the invention, processor 310 andchipset 320 are merged into a single SOC. In addition, chipset 320connects to one or more buses 350 and 355 that interconnect variouselements 374, 360, 362, 364, and 366. Buses 350 and 355 may beinterconnected together via a bus bridge 372. In one embodiment, chipset320 couples with a non-volatile memory 360, a mass storage device(s)362, a keyboard/mouse 364, and a network interface 366 via interface 324and/or 304, etc.

In one embodiment, mass storage device 362 includes, but is not limitedto, a solid state drive, a hard disk drive, a universal serial bus flashmemory drive, or any other form of computer data storage medium. In oneembodiment, network interface 366 is implemented by any type ofwell-known network interface standard including, but not limited to, anEthernet interface, a universal serial bus (USB) interface, a PeripheralComponent Interconnect (PCI) Express interface, a wireless interfaceand/or any other suitable type of interface. In one embodiment, thewireless interface operates in accordance with, but is not limited to,the IEEE 802.11 standard and its related family, Home Plug AV (HPAV),Ultra Wide Band (UWB), Bluetooth, WiMax, or any form of wirelesscommunication protocol.

While the components shown in FIG. 3 are depicted as separate blockswithin the system 300, the functions performed by some of these blocksmay be integrated within a single semiconductor circuit or may beimplemented using two or more separate integrated circuits. For example,although cache memory 316 is depicted as a separate block withinprocessor 310, cache memory 316 (or selected aspects of 316) can beincorporated into processor core 312.

Examples and Notes

The present subject matter may be described by way of several examples.

Example 1 can include a method of making a device including forming oneor more low density buildup layers on a core, the one or more lowdensity buildup layers each including an inorganic buildup material andconductive interconnect material on and through the inorganic buildupmaterial, the conductive interconnect material of the one or more lowdensity buildup layers electrically and mechanically connected toconductive interconnect material of the core, forming one or more highdensity buildup layers on an exposed low density buildup layer of theone or more low density buildup layers, the one or more high densitybuildup layers each including an organic buildup material withconductive interconnect material on and through the organic buildupmaterial, the conductive interconnect material of the high densitybuildup layers electrically and mechanically connected to the conductiveinterconnect material of the one or more low density buildup layers, andforming another low density buildup layer on and around an exposed highdensity buildup layer of the one or more high density buildup layers.

In Example 2, Example 1 can further include, wherein the organic buildupmaterial includes a photo-imageable dielectric (PID), and whereinforming the one or more high density buildup layers includes situatingthe PID on an exposed low density buildup layer of the one or more lowdensity buildup layers, patterning a photo resist material on thesituated PID to cover portions of the PID and expose portions of thePID, exposing and developing the exposed portions of the PID to removethe exposed portions and create a localized high density buildup layerthat includes the covered portions of the PID, forming one or more holesthrough the localized high density buildup layer, plating the one ormore holes and an exposed surface of the localized high density builduplayer with a conductive material, and patterning the conductive materialto form a portion of the conductive interconnect material of the highdensity buildup layer.

In Example 3, Example 2 can further include reducing a height of atleast a portion of the low density conductive interconnect materialbefore situating the PID on the exposed low density buildup layer of theone or more low density buildup layers.

In Example 4, Example 3 can further include, wherein reducing the heightof at least a portion of the low density conductive interconnectmaterial includes reducing the height of only a portion of the lowdensity conductive interconnect material that is within a footprint ofthe localized high density buildup layers.

In Example 5, Example 4 can further include before situating the PID onthe exposed layer of the one or more low density buildup layers,situating an adherence promoter on the portion of the low densityconductive interconnect material that includes the reduced height.

In Example 6, at least one of Examples 2-5 can include situating andpatterning a solder resist material on the another low density builduplayer to cover exposed portions of the low density buildup material andexposed portions of the low density conductive interconnect material.

In Example 7, at least one of Examples 1-6 can further include, whereinforming the one or more high density buildup layers includes situating asacrificial material on an exposed layer of the one or more low densitybuildup layers, situating the high density buildup material on thesacrificial material and a portion of the one or more low densitybuildup layers exposed by the sacrificial material, forming one or moreholes through the high density buildup material, plating the one or moreholes and an exposed surface of the high density buildup material with aconductive material, and patterning the conductive material to form aportion of the high density conductive material.

In Example 8, Example 7 can further include, wherein forming the one ormore low density buildup layers on the core includes forming an islandof conductive interconnect material on an exposed surface of the lowdensity interconnect material, the island electrically isolated from lowdensity conductive interconnect material and high density conductiveinterconnect material.

In Example 9, Example 8 can further include creating a notch through thehigh density buildup material that extends from an exposed surface ofthe one or more high density buildup layer to a laser resist materialbetween the high density buildup material and the high density buildupmaterial, wherein the laser resist material includes the island, andremoving the sacrificial material to create one or more localized highdensity buildup layers.

Example 10 can include a device that includes a core, first low densityconductive interconnect material on and in the core forming anelectrical pathway through the core, one or more low density builduplayers on the core and the low density conductive interconnect material,each of the one or more low density buildup layers including aninorganic buildup material and second low density conductiveinterconnect material in and on the inorganic buildup material, one ormore localized high density buildup layers on a layer of the one or morelow density buildup layers, each of the one or more localized highdensity buildup layers including an organic buildup material and highdensity conductive interconnect material in and on the organic buildupmaterial, and wherein the one or more low density buildup layersincludes a low density buildup layer on and around the one or more highdensity buildup layers.

In Example 11, Example 10 can further include a laser resist material ona low density buildup layer of the one or more low density builduplayers.

In Example 12, Example 11 can further include, wherein the laser resistmaterial includes the low density conductive interconnect material andwherein the laser resist material is electrically isolated from allother low density conductive interconnect material.

In Example 13, Example 12 can further include, wherein the organicbuildup material includes an epoxy-based laminate composite.

In Example 14, at least one of Examples 10-13 can further include,wherein a portion of the low density conductive interconnect materialthat is in direct electrical contact with the high density conductiveinterconnect material includes a height that is less than a height ofthe low density conductive interconnect material that is electricallyisolated from the high density conductive interconnect material.

In Example 15, Example 14 can further include an adhesion promoter onthe low density conductive interconnect material that includes theheight that is less than the height of the low density conductiveinterconnect material that is electrically isolated from the highdensity conductive interconnect material.

In Example 16, Example 15 can further include, wherein the organicbuildup material includes a photo-imageable dielectric.

Example 17 can include a device that includes a core including a firstsurface and a second surface opposite the first surface, first lowdensity conductive interconnect material on the first and secondsurfaces and in the core forming an electrical pathway between the firstand second surfaces, one or more low density buildup layers on the firstand second surfaces of the core and the low density conductiveinterconnect material, each of the one or more low density builduplayers including an inorganic buildup material and second low densityconductive interconnect material in and on the inorganic buildupmaterial, one or more localized high density buildup layers on a layerof the one or more low density buildup layers on the first surface, eachof the one or more localized high density buildup layers including anorganic buildup material and high density conductive interconnectmaterial in and on the organic buildup material, and wherein the one ormore low density buildup layers includes a low density buildup layer onand around the one or more high density buildup layers.

In Example 18, Example 17 can further include a solder resist materialon a low density buildup layer on the first surface and on a low densitybuildup layer on the second surface, the solder resist materialpatterned to cover the inorganic buildup material and expose portions ofthe low density conductive interconnect material.

In Example 19, at least one of Examples 17-18 can further include alaser resist material on a low density buildup layer of the one or morelow density buildup layers, wherein the laser resist material includesthe low density conductive interconnect material and wherein the laserresist material is electrically isolated from all other low densityconductive interconnect material.

In Example 20, at least one of Examples 17-19, wherein a portion of thelow density conductive interconnect material that is in directelectrical contact with the high density conductive interconnectmaterial includes a height that is less than a height of the low densityconductive interconnect material that is electrically isolated from thehigh density conductive interconnect material, and the device furthercomprises an adhesion promoter on the low density conductiveinterconnect material that includes the height that is less than theheight of the low density conductive interconnect material that iselectrically isolated from the high density conductive interconnectmaterial, and the organic buildup material includes a photo-imageabledielectric.

Each of these non-limiting examples can stand on its own, or can becombined in various permutations or combinations with one or more of theother examples.

The above detailed description includes references to the accompanyingdrawings, which form a part of the detailed description. The drawingsshow, by way of illustration, specific embodiments in which methods,apparatuses, and systems discussed herein can be practiced. Theseembodiments are also referred to herein as “examples.” Such examples caninclude elements in addition to those shown or described. However, thepresent inventors also contemplate examples in which only those elementsshown or described are provided. Moreover, the present inventors alsocontemplate examples using any combination or permutation of thoseelements shown or described (or one or more aspects thereof), eitherwith respect to a particular example (or one or more aspects thereof),or with respect to other examples (or one or more aspects thereof) shownor described herein.

In this document, the terms “a” or “an” are used, as is common in patentdocuments, to include one or more than one, independent of any otherinstances or usages of “at least one” or “one or more.” In thisdocument, the term “or” is used to refer to a nonexclusive or, such that“A or B” includes “A but not B,” “B but not A,” and “A and B,” unlessotherwise indicated. In this document, the terms “including” and “inwhich” are used as the plain-English equivalents of the respective terms“comprising” and “wherein.” Also, in the following claims, the terms“including” and “comprising” are open-ended, that is, a system, device,article, composition, formulation, or process that includes elements inaddition to those listed after such a term in a claim are still deemedto fall within the scope of that claim. Moreover, in the followingclaims, the terms “first,” “second,” and “third,” etc. are used merelyas labels, and are not intended to impose numerical requirements ontheir objects.

The above description is intended to be illustrative, and notrestrictive. For example, the above-described examples (or one or moreaspects thereof) may be used in combination with each other. Otherembodiments can be used, such as by one of ordinary skill in the artupon reviewing the above description. The Abstract is provided to allowthe reader to quickly ascertain the nature of the technical disclosure.It is submitted with the understanding that it will not be used tointerpret or limit the scope or meaning of the claims. Also, in theabove Detailed Description, various features may be grouped together tostreamline the disclosure. This should not be interpreted as intendingthat an unclaimed disclosed feature is essential to any claim. Rather,inventive subject matter may lie in less than all features of aparticular disclosed embodiment. Thus, the following claims are herebyincorporated into the Detailed Description as examples or embodiments,with each claim standing on its own as a separate embodiment, and it iscontemplated that such embodiments can be combined with each other invarious combinations or permutations. The scope of the invention shouldbe determined with reference to the appended claims, along with the fullscope of equivalents to which such claims are entitled.

What is claimed is:
 1. A device comprising: a core; a conductivematerial on and in the core forming an electrical pathway through thecore; one or more first buildup layers on the core and the first routinglayer, each of the one or more buildup layers including an inorganicbuildup material and a first routing layer in and on the inorganicbuildup material; one or more second buildup layers on a layer of theone or more first buildup layers, each of the one or more second builduplayers including an organic buildup material and a second routing layerin and on the organic buildup material; and wherein the one or morefirst buildup layers includes a buildup layer on and around the one ormore second buildup layers and the first routing layer includes a lowerrouting density than the second routing layer.
 2. The device of claim 1,further comprising: a laser resist material on a first buildup layer ofthe one or more first buildup layers.
 3. The device of claim 1, whereinthe laser resist material forms a part of the first routing layer. 4.The device of claim 3, wherein the organic buildup material includes anepoxy-based laminate composite.
 5. The device of claim 1, wherein aportion of the first routing layer that is in direct electrical contactwith the second routing includes a height that is less than a height ofthe first routing layer that is electrically isolated from the secondrouting layer.
 6. The device of claim 5, further comprising an adhesionpromoter on the first routing layer that includes the height that isless than the height of the first routing layer that is electricallyisolated from the second routing layer.
 7. The device of claim 6,wherein the organic buildup material includes a photo-imageabledielectric.
 8. A device comprising: a core including a first surface anda second surface opposite the first surface; a conductive interconnectmaterial on the first and second surfaces and in the core forming anelectrical pathway between the first and second surfaces; one or morefirst buildup layers on the first and second surfaces of the core andthe first conductive interconnect material, each of the one or morefirst buildup layers including an inorganic buildup material and a firstrouting layer in and on the inorganic buildup material; one or moresecond buildup layers on a layer of the one or more first buildup layerson the first surface, each of the one or more second density builduplayers including an organic buildup material and a second routing layerin and on the organic buildup material; and wherein the one or morefirst buildup layers includes a first buildup layer on and around theone or more second buildup layers and the first routing layer includes alower routing density than the second routing layer.
 9. The device ofclaim 8, further comprising: a solder resist material on a first builduplayer of the first buildup layers on the first surface and on a secondbuildup layer of the first buildup layers on the second surface, thesolder resist material patterned to cover the inorganic buildup materialand expose portions of the first routing layer.
 10. The device of claim8, further comprising: a laser resist material on a first buildup layerof the one or more first buildup layers, wherein the laser resistmaterial forms a portion of the first routing layer.
 11. The device ofclaim 8, wherein: a portion of the first routing layer that is in directelectrical contact with the second routing layer includes a height thatis less than a height of the first routing layer that is electricallyisolated from the second routing layer, the device further comprises anadhesion promoter on the first routing layer that includes the heightthat is less than the height of the first routing layer that iselectrically isolated from the second routing layer, and the organicbuildup material includes a photo-imageable dielectric.